X-Ray Diffraction Objective Questions and Answers | X-Ray Diffraction MCQs

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Questions
1 The relationship between minimum wavelength of X-radiation generated from a target metal and applied voltage is given by
A Bragg’s equation
B Moseley equation
C Illkovik equation
D Duane-Hunt equation

Answer:Duane-Hunt equation
2 As the applied voltage increases, the minimum wavelength of X-radiation from a metal
A Increases
B Decreases
C Remains same
D Variable with metal

Answer:Decreases
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3 Which of the following has long wavelength
A Kα1
B Kβ1
C Kα2
D Kβ2

Answer:None of the above
4 In goniometer, if analyzing crystal rotates at angle of 30 o, the detector should rotate at an angle of
A 15°
B 30°
C 45°
D 60°

Answer:60°
5 As the atomic number increases, the frequency of X-radiation from a target material
A Increases
B Decreases
C Remains same
D Variable with metal

Answer:Increases
6 If the atomic number of copper and molybdenum are 29 and 42 respectively, longer wavelengths of K a line is produced by
A Copper
B Molybdenum
C Both
D None

Answer:Copper
7 In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
A Number, length
B Number, intensity
C Position, length
D Position, intensity

Answer:Position, intensity
8 Diffractometers are similar to which of the following?
A Optical grating spectrometer
B Prism spectrometer
C Photo multiplier
D Photovoltaic cell

Answer:Optical grating spectrometer
9 In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
A Number
B Position
C Length
D Distance between lines

Answer:Number
10 In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
A Quality of the sample, size of the slit
B Quality of the slit, size of the sample
C Thickness of the slit, amount of the sample
D Number of slits, composition of the sample

Answer:Quality of the slit, size of the sample

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